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Piezoelectric and ferroelectric measurements on casted target-deposited Al0.45Sc0.45B0.1N thin films

This study reports on the characterization of a 45% scandium-doped Aluminum Nitride (AlScN) thin films co-doped with 10% Boron (B). AlScBN thin films were deposited on Si (100) 200 mm wafers using a pulsed DC reactive magnetron sputtering system. A 4″ casted alloy target of Al0.45Sc0.45B0.10 was use...

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Principais autores: Kapil Saha, Pietro Simeoni, Luca Colombo, Matteo Rinaldi
Format: Artigo
Jezik:Inglês
Izdano: Frontiers Media S.A. 2025-04-01
Serija:Frontiers in Materials
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Online dostop:https://www.frontiersin.org/articles/10.3389/fmats.2025.1567614/full
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