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Analytical Modeling and Experimental Validation of Threshold Voltage in BSIM6 MOSFET Model

In this paper, an analytical model of threshold voltage for bulk MOSFET is developed. The model is derived from the physical charge-based core of BSIM6 MOSFET model, taking into account short channel effects, and is intended to be used in commercial SPICE simulators for operating point information....

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Bibliografiske detaljer
Principais autores: Harshit Agarwal, Chetan Gupta, Pragya Kushwaha, Chandan Yadav, Juan P. Duarte, Sourabh Khandelwal, Chenming Hu, Yogesh S. Chauhan
Format: Artigo
Sprog:Inglês
Udgivet: IEEE 2015-01-01
Serier:IEEE Journal of the Electron Devices Society
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Online adgang:https://ieeexplore.ieee.org/document/7064732/
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