Ohmic-to-Schottky Modification of Zno-Metal Contact Modulated by Film Thickness

This work investigated the charge transport behavior at the interface between a Pt-Ir metal contact and transparent zinc oxide (ZnO) electrodes with one, four, and eight ZnO layers. Electrostatic force microscopy (EFM), Kelvin probe force microscopy (KPFM), and conducting atomic force microscopy (c-...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής

Κύριοι συγγραφείς:	Raquele Lima Moreira, Luis Paulo Mourão dos Santos, Francisco Carlos Carneiro Soares Salomão, Eduardo B. Barros, Igor Frota Vasconcelos
Μορφή:	Artigo
Γλώσσα:	Inglês
Έκδοση:	Associação Brasileira de Metalurgia e Materiais (ABM); Associação Brasileira de Cerâmica (ABC); Associação Brasileira de Polímeros (ABPol) 2025-06-01
Σειρά:	Materials Research
Θέματα:	Ohmic contact Schottky contact zinc oxide electrodes thin films grain boundaries
Διαθέσιμο Online:	http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392025000200235&lng=en&tlng=en
Ετικέτες:	Προσθήκη ετικέτας Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!