Analysis strategies for time-resolved X-ray solution scattering at high repetition rate XFEL sources

With the start of the user program at the European XFEL in 2017, and more recently with the LCLS-II upgrade, the X-ray repetition rate at X-ray free-electron lasers (XFELs) has been pushed into the kilo- and megahertz regimes. These high X-ray repetition rates provide an increase in the integrated f...

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Detalhes bibliográficos

Principais autores:	Morten Lunn Haubro, Diana Bregenholt Zederkof, Dmitry Khakhulin, Hazem Yousef, Yifeng Jiang, Ivette Jazmin Bermudez Macias, Thomas Kluyver, Frederico Lima, Mykola Biednov, Christopher Milne, Yohei Uemura, Peter Zalden, Hao Wang, Asmus Ougaard Dohn, Kerstin Mitterer, Verena Markmann, Oliver Ohlson, Martha Tordis Wachter-Lehn, Philipp Lenzen, Benedikte Knorr Jensen, Alberte Høholdt, Tim Brandt van Driel, Amke Nimmrich, Elli Selenius, Gianluca Levi, Klaus Braagaard Møller, Martin Meedom Nielsen, Kristoffer Haldrup
Formato:	Artigo
Idioma:	Inglês
Publicado em:	International Union of Crystallography 2026-01-01
coleção:	Journal of Synchrotron Radiation
Assuntos:	xfel high repetition rate sample destruction solution scattering
Acesso em linha:	https://journals.iucr.org/paper?S1600577525009737
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