In Situ Optical Monitoring and Morphological Evolution of Si Nanowires Grown on Faceted Al<sub>2</sub>O<sub>3</sub>(0001) Substrates
This paper presents the growth and in situ optical characterization of silicon nanowires (Si NWs) on Al<sub>2</sub>O<sub>3</sub>(0001) substrates that are thermally faceted using the atomic low angle shadowing technique (ATLAS) method. Annealing Al<sub>2</sub>O<sub>3</sub> substrates in air before s...
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| Principais autores: | , , , , , , |
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| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
MDPI AG
2025-10-01
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| 叢編: | Nanomaterials |
| 主題: | |
| 在線閱讀: | https://www.mdpi.com/2079-4991/15/20/1589 |
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