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Bias-Repeatability Analysis of Vacuum-Packaged 3-Axis MEMS Gyroscope Using Oven-Controlled System

The performance of microelectromechanical system (MEMS) inertial measurement units (IMUs) is susceptible to many environmental factors. Among different factors, temperature is one of the most challenging issues. This report reveals the bias stability analysis of an ovenized MEMS gyroscope. A micro-h...

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Principais autores: Hussamud Din, Faisal Iqbal, Jiwon Park, Byeungleul Lee
Formato: Artigo
Idioma:Inglês
Publicado: MDPI AG 2022-12-01
Series:Sensors
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Acceso en liña:https://www.mdpi.com/1424-8220/23/1/256
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