Spiking test-based evaluation of semiconductor wastewater reuse process under shock-loading conditions: Removal of TMAH and metal(loid) contaminants

Stable treatment performance is essential for semiconductor wastewater reuse systems under shock-loading conditions. This study evaluated the removal behavior of tetramethylammonium hydroxide (TMAH) and selected metal(loid)s in a lab-scale semiconductor wastewater reuse system consisting of coagulat...

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Библиографические подробности

Главные авторы:	Deokhwan Kim, Jonghun Lee, Jeonghoo Sim, Yuying Liu, Byung-Moon Jun, June-Seok Choi, Hojung Rho
Формат:	Artigo
Язык:	Inglês
Опубликовано:	Elsevier 2026-04-01
Серии:	Desalination and Water Treatment
Предметы:	Semiconductor wastewater reuse Shock loading Tetramethylammonium hydroxide Metal(loid)s
Online-ссылка:	http://www.sciencedirect.com/science/article/pii/S1944398626001463
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