RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simula...

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Détails bibliographiques
Publié dans:Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik
Auteur principal: Müller, Daniel
Format: Livro
Langue:Inglês
Publié: KIT Scientific Publishing 2018
Sujets:
T1-995
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
On-Wafer Measurements
Monolithic Microwave Integrated Circuits
Halbleiterschaltungen
Messtechnik
Hochfrequenztechnik
Electromagnetic Field Simulation
Elektromagnetische Feldsimulation
Radio Frequency
Accès en ligne:https://directory.doabooks.org/handle/20.500.12854/58448
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