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Novel algorithms for fast statistical analysis of scaled circuits
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the c...
Shranjeno v:
| Main Authors: | , |
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| Format: | Livro |
| Jezik: | Inglês |
| Izdano: |
Springer Netherlands :,
2009
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| Teme: | |
| Online dostop: | https://minerva.ufrj.br/F/?func=direct&doc_number=000931336&local_base=UFR01 |
| Oznake: |
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