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Nanometer technology designs high-quality delay tests /
While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip...
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| 主要作者: | |
|---|---|
| 格式: | Livro |
| 語言: | Inglês |
| 出版: |
Springer US,
2008
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| 主題: | |
| 在線閱讀: | https://minerva.ufrj.br/F/?func=direct&doc_number=000897720&local_base=UFR01 |
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