Resultados da pesquisa por Autor

1

Optical Metrology under Extreme Conditions

Optical Metrology under Extreme Conditions

Por Xide Li, Giancarlo Pedrini, Yu Fu
Publicado em 2014-01-01

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2

A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application

A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application

Por Xuan Ye, Zhiguo Cui, Huajun Fang, Xide Li
Publicado em 2017-08-01

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