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Por Sharma, M, Clark, H, Armour, T, Stotts, G, Coté, R, Hill, M D, Demchuck, A M, Moher, D, Garritty, C, Yazdi, F, Lumely-Leger, K, Murdock, M, Sampson, M, Barrowman, N, Lewin, G
Publicado no Evid Rep Technol Assess (Summ) (2005)
Obter o texto integralPublicado no Evid Rep Technol Assess (Summ) (2005)
Obter o texto integral
Artigo