1
2
Por Rostom, A, Dubé, C, Cranney, A, Saloojee, N, Sy, R, Garritty, C, Sampson, M, Zhang, L, Yazdi, F, Mamaladze, V, Pan, I, McNeil, J, Moher, D, Mack, D, Patel, D
Publicado no Evid Rep Technol Assess (Summ) (2004)
Obter o texto integralPublicado no Evid Rep Technol Assess (Summ) (2004)
Obter o texto integral
Artigo
3
Por Sharma, M, Clark, H, Armour, T, Stotts, G, Coté, R, Hill, M D, Demchuck, A M, Moher, D, Garritty, C, Yazdi, F, Lumely-Leger, K, Murdock, M, Sampson, M, Barrowman, N, Lewin, G
Publicado no Evid Rep Technol Assess (Summ) (2005)
Obter o texto integralPublicado no Evid Rep Technol Assess (Summ) (2005)
Obter o texto integral
Artigo