Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

por Gysin, Urs, Glatzel, Thilo, Schmölzer, Thomas, Schöner, Adolf, Reshanov, Sergey, Bartolf, Holger, Meyer, Ernst
Publicado en Beilstein J Nanotechnol (2015)

Nanoscale characterization of electrical transport at metal/3C-SiC interfaces

por Eriksson, Jens, Roccaforte, Fabrizio, Reshanov, Sergey, Leone, Stefano, Giannazzo, Filippo, LoNigro, Raffaella, Fiorenza, Patrick, Raineri, Vito
Publicado 2011