Light-Induced Peroxide Formation in ZnO: Origin of Persistent Photoconductivity

Por Kang, Youngho, Nahm, Ho-Hyun, Han, Seungwu
Publicado no Sci Rep (2016)

Origin of Degradation Phenomenon under Drain Bias Stress for Oxide Thin Film Transistors using IGZO and IGO Channel Layers

Por Bak, Jun Yong, Kang, Youngho, Yang, Shinhyuk, Ryu, Ho-Jun, Hwang, Chi-Sun, Han, Seungwu, Yoon, Sung-Min
Publicado no Sci Rep (2015)

Origin of the improved mobility and photo-bias stability in a double-channel metal oxide transistor

Por Jung, Hong Yoon, Kang, Youngho, Hwang, Ah Young, Lee, Chang Kyu, Han, Seungwu, Kim, Dae-Hwan, Bae, Jong-Uk, Shin, Woo-Sup, Jeong, Jae Kyeong
Publicado em 2014