In situ and real-time monitoring of structure formation during non-reactive sputter deposition of lanthanum and reactive sputter deposition of lanthanum nitride

Por Krause, Bärbel, Kuznetsov, Dmitry S., Yakshin, Andrey E., Ibrahimkutty, Shyjumon, Baumbach, Tilo, Bijkerk, Fred
Publicado no J Appl Crystallogr (2018)

Tuning of large piezoelectric response in nanosheet-buffered lead zirconate titanate films on glass substrates

Por Chopra, Anuj, Bayraktar, Muharrem, Nijland, Maarten, ten Elshof, Johan E., Bijkerk, Fred, Rijnders, Guus
Publicado no Sci Rep (2017)

Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources

Por Sobierajski, Ryszard, Loch, Rolf Antonie, van de Kruijs, Robbert W. E., Louis, Eric, von Blanckenhagen, Gisela, Gullikson, Eric M., Siewert, Frank, Wawro, Andrzej, Bijkerk, Fred
Publicado em 2013

High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region

Por Huang, Qiushi, Yi, Qiang, Cao, Zhaodong, Qi, Runze, Loch, Rolf A., Jonnard, Philippe, Wu, Meiyi, Giglia, Angelo, Li, Wenbin, Louis, Eric, Bijkerk, Fred, Zhang, Zhong, Wang, Zhanshan
Publicado no Sci Rep (2017)