MATHEMATICAL MODELING OF A DISTANCE DEPENDENCE OF A SCANNING KELVIN PROBE LATERAL RESOLUTION

द्वारा A. K. Tyavlovsky
प्रकाशित 2015-04-01

THE ANALYSIS OF DIELECTRICS' SURFACE POTENTIAL MEASURING TECHNIQUE BASED ON A CURRENT FEEDBACK SCHEME

द्वारा A. K. Tyavlovsky, A. L. Zharin
प्रकाशित 2015-04-01

COMPENSATION OF MEASUREMENT ERRORS WHEN REDUCING LINEAR DIMENSIONS OF THE KELVIN PROBE

द्वारा A. K. Tyavlovsky, A. L. Zharin
प्रकाशित 2015-03-01

METROLOGICAL PERFORMANCE MODELING OF PROBE ELECTROMETERS CAPACITIVE SENSORS

द्वारा A. K. Tyavlovsky, O. K. Gusev, A. L. Zharin
प्रकाशित 2015-04-01

DIGITAL CONTACT POTENTIAL DIFFERENCE PROBE

द्वारा K. U. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, A. L. Zharin
प्रकाशित 2016-09-01

Determination of Type and Concentration of Electrolyte Solution on the Basis of Analysis of Potentiodynamic Curves

द्वारा R. I. Vorobey, O. K. Gusev, V. P. Kiryeenko, A. K. Tyavlovsky, K. L. Tyavlovsky, V. B. Yarzhembitsky
प्रकाशित 2003-04-01

Measuring transducers for optical diagnostic system with multifunctional unitary photovoltaic converters

द्वारा R. I. Vorobei, O. K. Gusev, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, L. I. Shadurskaya
प्रकाशित 2018-09-01

KELVIN PROBE SELF-CALIBRATION MODE FOR SEMICONDUCTOR WAFERS PROPERTIES MONITORING

द्वारा R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky
प्रकाशित 2015-03-01

ANALYSIS OF SURFACE DEFECTS OF ALUMINUM AND ITS ALLOYS WITH A SCANNING KELVIN PROBE

द्वारा A. K. Tyavlovsky, A. L. Zharin, O. K. Gusev, R. I. Varabei, N. I. Muhurov, G. V. Sharonov, K. U. Pantsialeyeu
प्रकाशित 2017-02-01

KELVIN PROBE’S STRAY CAPACITANCE AND NOISE SIMULATION

द्वारा S. Danyluk, A. V. Dubanevich, O. K. Gusev, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, R. I. Vorobey, A. L. Zharin
प्रकाशित 2015-03-01

STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL

द्वारा R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky
प्रकाशित 2015-03-01

STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL

द्वारा R. I. Vorobey, O. K. Gusev, A. L. Zharin, A. N. Petlitsky, V. A. Pilipenko, A. S. Turtsevitch, A. K. Tyavlovsky, K. L. Tyavlovsky
प्रकाशित 2015-03-01

THE MULTIFUNCTION MEASURING CONVERTER FOR MONITORING OF LIQUID TECHNOLOGICAL MEDIA

द्वारा R. I. Vorobey, O. K. Gusev, A. L. Zharin, Yu. G. Kuzminsky, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, S. V. Shilko
प्रकाशित 2015-04-01

Series of Photovoltaic Converters Based on Semiconductors with Intrinsic Photoconductivity

द्वारा R. I. Vorobey, O. K. Gusev, A. L. Zharin, K. U. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky, L. I. Shadurskaya
प्रकाशित 2021-06-01

CHARACTERIZATION OF THE ELECTROPHYSICAL PROPERTIES OF SILICON-SILICON DIOXIDE INTERFACE USING PROBE ELECTROMETRY METHODS

द्वारा V. А. Pilipenko, V. A. Saladukha, V. A. Filipenya, R. I. Vorobey, O. K. Gusev, A. L. Zharin, K. V. Pantsialeyeu, A. I. Svistun, A. K. Tyavlovsky, K. L. Tyavlovsky
प्रकाशित 2017-12-01