Alternative method to determine the bulk etch rate of LR-115 detectors
The measurements using the LR 115 solid-state nuclear track detector (SSNTD) depend critically on the removed thickness of the active layer during etching. In this work, LR 115 detectors exposed to alpha particles were etched under no stirring in a 2.5 N NaOH solution at a temperature of 60±1◦ C and...
Αποθηκεύτηκε σε:
| Εκδόθηκε σε: | Revista Mexicana de Física |
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| Κύριοι συγγραφείς: | , , , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
Sociedad Mexicana de Física A.C.
2010
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| Θέματα: | |
| Διαθέσιμο Online: | https://www.redalyc.org/articulo.oa?id=57030351005 |
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