Ageing effects on polymeric track detectors: studies of etched tracks at nanosize scale using atomic force microscope
Among several different techniques to analyze material surface, the use of Atomic Force Microscope (AFM) is one of the finest method. As we know, the sensitivity to detect energetic ions is extremely affected during the storage time and conditions of the polymeric material used as a nuclear track de...
में बचाया:
| में प्रकाशित: | Revista Mexicana de Física |
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| मुख्य लेखकों: | , , , , , , |
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
Sociedad Mexicana de Física A.C.
2012
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| विषय: | |
| ऑनलाइन पहुंच: | https://www.redalyc.org/articulo.oa?id=57023406007 |
| टैग: |
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