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Desorption influence of water on structural, electrical properties and molecular order of vanadium pentoxide xerogel films

Vanadium pentoxide xerogel films were grown by sol-gel method on pre-treated glass substrates, the gelation time was 14 days. The crystallinity of the films was analyzed with X-ray diffraction (XRD), identifying the composite V2O5·nH2O before, and both vanadium pentoxide xerogel and α·V2O5...

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Publicat a:Revista Mexicana de Física
Autors principals: C.L. Londoño-Calderón, C. Vargas-Hernández, J.F. Jurado
Format: Artigo
Idioma:Inglês
Publicat: Sociedad Mexicana de Física A.C. 2010
Matèries:
XRD
Accés en línia:https://www.redalyc.org/articulo.oa?id=57019827008
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