Computation of crack tip elastic stress intensity factor in mode I by in-plane electronic speckle pattern interferometry
In this work, a dual illumination beam system is used to obtain the stress intensity factor in modes one (mode I) to mechanical elements during tension testing. The displacement field is obtained by means of electronic speckle pattern interferometry and phase stepping technique. Deformations are cal...
Uloženo v:
| Vydáno v: | Revista Mexicana de Física |
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| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Sociedad Mexicana de Física A.C.
2010
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| Témata: | |
| On-line přístup: | https://www.redalyc.org/articulo.oa?id=57019827005 |
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