Multipactor suppressing titanium nitride thin films analyzed through XPS and AES
Cathodic-magnetron-deposited titanium nitride films were grown on anodized aluminum substrates and studied via AES and XPS spectroscopies to determine their depth-dependence composition. As it is well known, the native oxide grown on aluminum does not make the substrate impervious to radio frequency...
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| Yayımlandı: | Revista Mexicana de Física |
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| Asıl Yazarlar: | , , , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Sociedad Mexicana de Física A.C.
2008
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| Konular: | |
| Online Erişim: | https://www.redalyc.org/articulo.oa?id=57019064009 |
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