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Transmission Electron Microscopy (TEM) Through Focused ION Beam (FIB) from Vitrified Chromium Wastes
This study shows how the Focused Ion Beam (FIB) has been applied to vitrified materials obtained from chromium wastes. Due to the issues arising during conventional Ar+ ion milling, it was necessary to thin these samples using FIB. Difficulties came from the heterogeneous size between chromium spine...
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| Publicat a: | Journal of Applied Research and Technology |
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| Autors principals: | , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Universidad Nacional Autónoma de México
2011
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| Matèries: | |
| Accés en línia: | https://www.redalyc.org/articulo.oa?id=47419293009 |
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