Characterization of Co-evaporated Cu-Ag-In-Se Thin Films
In this study, annealing effect on the structural, electrical, and optical characteristics of the quaternary Cu- Ag-In-Se (CAIS) thin films was investigated. These samples were deposited by co-evaporation of the Cu, Ag, In2Se3, and Se sources at the substrate temperature of 300 °C. The structural pr...
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| Gepubliceerd in: | Brazilian Journal of Physics |
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| Hoofdauteurs: | , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Sociedade Brasileira de Física
2014
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| Onderwerpen: | |
| Online toegang: | https://www.redalyc.org/articulo.oa?id=46432477016 |
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