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Early fault detection in SiC-MOSFET with application in boost converter

This paper presents the design of a fault detection circuit applied to a silicon carbide Mosfet (SiC-Mosfet). Fault detection is done by monitoring the behavior of the gate signal. The most important characteristic that has been reported in literature is quick detection since the evaluation is done...

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Vydáno v:Revista Facultad de Ingeniería Universidad de Antioquia
Hlavní autoři: Leobardo Hernández-González, Climaco Arvizu-Ogilvie, Alejandro Tapia-Hernández, Mario Ponce-Silva, Abraham Claudio-Sánchez, Marco Rodríguez-Blanco, Jesús Aguayo-Alquicira
Médium: Artigo
Jazyk:Inglês
Vydáno: Universidad de Antioquia 2018
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On-line přístup:https://www.redalyc.org/articulo.oa?id=43057399002
https://www.redalyc.org/journal/430/43057399002/
https://www.redalyc.org/journal/430/43057399002/html/
https://www.redalyc.org/journal/430/43057399002/43057399002.epub
https://www.redalyc.org/journal/430/43057399002/movil
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