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Soft X-ray nanospectroscopy for quantification of X-ray linear dichroism on powders
X-ray linear dichroism (XLD) is a fundamental property of many ordered materials that can for instance provide information on the origin of magnetic properties and the existence of differently ordered domains. Conventionally, measurements of XLD are performed on single crystals, crystalline thin fil...
Gorde:
| Argitaratua izan da: | J Synchrotron Radiat |
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| Egile Nagusiak: | , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
International Union of Crystallography
2021
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8284400/ https://ncbi.nlm.nih.gov/pubmed/34212872 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577521004021 |
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