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Quantitative Visualization of the Nanomechanical Young’s Modulus of Soft Materials by Atomic Force Microscopy

The accurate measurement of nanoscale mechanical characteristics is crucial in the emerging field of soft condensed matter for industrial applications. An atomic force microscope (AFM) can be used to conduct nanoscale evaluation of the Young’s modulus on the target surface based on site-specific for...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:Nanomaterials (Basel)
Päätekijät: Kim, Seongoh, Lee, Yunkyung, Lee, Manhee, An, Sangmin, Cho, Sang-Joon
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: MDPI 2021
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC8234525/
https://ncbi.nlm.nih.gov/pubmed/34204454
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano11061593
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