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Determining amplitude and tilt of a lateral force microscopy sensor
In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the osci...
Shranjeno v:
| izdano v: | Beilstein J Nanotechnol |
|---|---|
| Main Authors: | , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
Beilstein-Institut
2021
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| Teme: | |
| Online dostop: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8182685/ https://ncbi.nlm.nih.gov/pubmed/34136327 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.12.42 |
| Oznake: |
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