Lanean...
Determining amplitude and tilt of a lateral force microscopy sensor
In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the osci...
Gorde:
| Argitaratua izan da: | Beilstein J Nanotechnol |
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| Egile Nagusiak: | , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Beilstein-Institut
2021
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8182685/ https://ncbi.nlm.nih.gov/pubmed/34136327 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.12.42 |
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