Improving the precision of optical metrology by detecting fewer photons with biased weak measurement

In optical metrological protocols to measure physical quantities, it is, in principle, always beneficial to increase photon number n to improve measurement precision. However, practical constraints prevent the arbitrary increase of n due to the imperfections of a practical detector, especially when...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Light Sci Appl
Hlavní autoři: Yin, Peng, Zhang, Wen-Hao, Xu, Liang, Liu, Ze-Gang, Zhuang, Wei-Feng, Chen, Lei, Gong, Ming, Ma, Yu, Peng, Xing-Xiang, Li, Gong-Chu, Xu, Jin-Shi, Zhou, Zong-Quan, Zhang, Lijian, Chen, Geng, Li, Chuan-Feng, Guo, Guang-Can
Médium: Artigo
Jazyk:Inglês
Vydáno: Nature Publishing Group UK 2021
Témata:
Article
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC8128924/
https://ncbi.nlm.nih.gov/pubmed/34001846
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41377-021-00543-4
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!

Podobné jednotky