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Improving the precision of optical metrology by detecting fewer photons with biased weak measurement
In optical metrological protocols to measure physical quantities, it is, in principle, always beneficial to increase photon number n to improve measurement precision. However, practical constraints prevent the arbitrary increase of n due to the imperfections of a practical detector, especially when...
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| Pubblicato in: | Light Sci Appl |
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| Autori principali: | , , , , , , , , , , , , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Nature Publishing Group UK
2021
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8128924/ https://ncbi.nlm.nih.gov/pubmed/34001846 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41377-021-00543-4 |
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