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Magnification inferred curvature for real-time curvature monitoring

The in situ and real-time measurement of curvature changes of optically reflecting surfaces is a key element to better control bottom-up fabrication processes in the semiconductor industry, but also to follow or adjust mirror deformations during fabrication and use for space or optics industries. De...

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Bibliografski detalji
Izdano u:Sci Rep
Glavni autori: Arnoult, Alexandre, Colin, Jonathan
Format: Artigo
Jezik:Inglês
Izdano: Nature Publishing Group UK 2021
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC8087714/
https://ncbi.nlm.nih.gov/pubmed/33931683
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-021-88722-6
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