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Synchrotron total-scattering data applicable to dual-space structural analysis
Synchrotron powder X-ray diffraction (PXRD) is a well established technique for investigating the atomic arrangement of crystalline materials. At modern beamlines, X-ray scattering data can be collected in a total-scattering setting, which additionally opens up the opportunity for direct-space struc...
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| Publicado en: | IUCrJ |
|---|---|
| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
International Union of Crystallography
2021
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8086158/ https://ncbi.nlm.nih.gov/pubmed/33953925 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252521001664 |
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