A carregar...

Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure

We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. Th...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:Nanomaterials (Basel)
Main Authors: Slouf, Miroslav, Skoupy, Radim, Pavlova, Ewa, Krzyzanek, Vladislav
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2021
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8070269/
https://ncbi.nlm.nih.gov/pubmed/33918700
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano11040962
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!