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Bayesian Particle Instance Segmentation for Electron Microscopy Image Quantification

[Image: see text] Automating the analysis portion of materials characterization by electron microscopy (EM) has the potential to accelerate the process of scientific discovery. To this end, we present a Bayesian deep-learning model for semantic segmentation and localization of particle instances in...

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Detalhes bibliográficos
Publicado no:J Chem Inf Model
Main Authors: Yildirim, Batuhan, Cole, Jacqueline M.
Formato: Artigo
Idioma:Inglês
Publicado em: American Chemical Society 2021
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8041280/
https://ncbi.nlm.nih.gov/pubmed/33682402
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jcim.0c01455
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