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Bayesian Particle Instance Segmentation for Electron Microscopy Image Quantification
[Image: see text] Automating the analysis portion of materials characterization by electron microscopy (EM) has the potential to accelerate the process of scientific discovery. To this end, we present a Bayesian deep-learning model for semantic segmentation and localization of particle instances in...
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| Publicado no: | J Chem Inf Model |
|---|---|
| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
American Chemical
Society
2021
|
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8041280/ https://ncbi.nlm.nih.gov/pubmed/33682402 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jcim.0c01455 |
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