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Study of a Gate-Engineered Vertical TFET with GaSb/GaAs(0.5)Sb(0.5) Heterojunction

It is well known that the vertical tunnel field effect transistor (TFET) is easier to fabricate than the conventional lateral TFETs in technology. Meanwhile, a lightly doped pocket under the source region can improve the subthreshold performance of the vertical TFETs. This paper demonstrates a dual...

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Pubblicato in:Materials (Basel)
Autori principali: Xie, Haiwu, Chen, Yanning, Liu, Hongxia, Guo, Dan
Natura: Artigo
Lingua:Inglês
Pubblicazione: MDPI 2021
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Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC7998445/
https://ncbi.nlm.nih.gov/pubmed/33804142
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma14061426
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