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Annealing of focused ion beam damage in gold microcrystals: an in situ Bragg coherent X-ray diffraction imaging study
Focused ion beam (FIB) techniques are commonly used to machine, analyse and image materials at the micro- and nanoscale. However, FIB modifies the integrity of the sample by creating defects that cause lattice distortions. Methods have been developed to reduce FIB-induced strain; however, these prot...
Gardado en:
| Publicado en: | J Synchrotron Radiat |
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| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
International Union of Crystallography
2021
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7941296/ https://ncbi.nlm.nih.gov/pubmed/33650568 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577520016264 |
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