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Using deep learning for pixel-defect corrections in flat-panel radiography imaging
Purpose: Flat-panel radiography detectors employ thin-film transistor (TFT) panels to acquire high-quality x-ray images. Pixel defects occur due to circuit shorts or opens in the TFT panel. The defects may degrade the image quality, as well as lower the production yield, and eventually raise the pro...
Uloženo v:
| Vydáno v: | J Med Imaging (Bellingham) |
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| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Society of Photo-Optical Instrumentation Engineers
2021
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7930811/ https://ncbi.nlm.nih.gov/pubmed/33681407 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/1.JMI.8.2.023501 |
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