Candidate Genes and Quantitative Trait Loci for Grain Yield and Seed Size in Durum Wheat

Grain yield (YLD) is affected by thousand kernel weight (TKW) which reflects the combination of grain length (GL), grain width (GW) and grain area (AREA). Grain weight is also influenced by heading time (HT) and plant height (PH). To detect candidate genes and quantitative trait loci (QTL) of yield...

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Bibliografische gegevens
Gepubliceerd in:Plants (Basel)
Hoofdauteurs: Mangini, Giacomo, Blanco, Antonio, Nigro, Domenica, Signorile, Massimo Antonio, Simeone, Rosanna
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: MDPI 2021
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Article
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7916090/
https://ncbi.nlm.nih.gov/pubmed/33562879
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/plants10020312
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