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Candidate Genes and Quantitative Trait Loci for Grain Yield and Seed Size in Durum Wheat
Grain yield (YLD) is affected by thousand kernel weight (TKW) which reflects the combination of grain length (GL), grain width (GW) and grain area (AREA). Grain weight is also influenced by heading time (HT) and plant height (PH). To detect candidate genes and quantitative trait loci (QTL) of yield...
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| 出版年: | Plants (Basel) |
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| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI
2021
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7916090/ https://ncbi.nlm.nih.gov/pubmed/33562879 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/plants10020312 |
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