Candidate Genes and Quantitative Trait Loci for Grain Yield and Seed Size in Durum Wheat

Grain yield (YLD) is affected by thousand kernel weight (TKW) which reflects the combination of grain length (GL), grain width (GW) and grain area (AREA). Grain weight is also influenced by heading time (HT) and plant height (PH). To detect candidate genes and quantitative trait loci (QTL) of yield...

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Shranjeno v:
Bibliografske podrobnosti
izdano v:Plants (Basel)
Main Authors: Mangini, Giacomo, Blanco, Antonio, Nigro, Domenica, Signorile, Massimo Antonio, Simeone, Rosanna
Format: Artigo
Jezik:Inglês
Izdano: MDPI 2021
Teme:
Article
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC7916090/
https://ncbi.nlm.nih.gov/pubmed/33562879
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/plants10020312
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