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Characterization and fine mapping of a new dwarf mutant in Brassica napus

BACKGROUND: Plant height is an important plant characteristic closely related to yield performance of many crops. Reasonable reduction of plant height of crops is beneficial for improving yield and enhancing lodging resistance. RESULTS: In the present study, we described the Brassica napus dwarf mut...

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Detalhes bibliográficos
Publicado no:BMC Plant Biol
Main Authors: Li, Xin, Xiang, Fujiang, Zhang, Wei, Yan, Jindong, Li, Xinmei, Zhong, Ming, Yang, Piao, Chen, Caiyan, Liu, Xuanming, Mao, Donghai, Zhao, Xiaoying
Formato: Artigo
Idioma:Inglês
Publicado em: BioMed Central 2021
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7908660/
https://ncbi.nlm.nih.gov/pubmed/33637037
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s12870-021-02885-y
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