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Bulk chemical composition contrast from attractive forces in AFM force spectroscopy
A key application of atomic force microscopy (AFM) is the measurement of physical properties at sub-micrometer resolution. Methods such as force–distance curves (FDCs) or dynamic variants (such as intermodulation AFM (ImAFM)) are able to measure mechanical properties (such as the local stiffness, k(...
שמור ב:
| הוצא לאור ב: | Beilstein J Nanotechnol |
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| Main Authors: | , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Beilstein-Institut
2021
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7849247/ https://ncbi.nlm.nih.gov/pubmed/33564603 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.12.5 |
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