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Scalable long read self-correction and assembly polishing with multiple sequence alignment
Third-generation sequencing technologies allow to sequence long reads of tens of kbp, that are expected to solve various problems. However, they display high error rates, currently capped around 10%. Self-correction is thus regularly used in long reads analysis projects. We introduce CONSENT, a new...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2021
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7804095/ https://ncbi.nlm.nih.gov/pubmed/33436980 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-80757-5 |
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