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Swept-Source-Based Chromatic Confocal Microscopy
Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed t...
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| Publicado no: | Sensors (Basel) |
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| Principais autores: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7767395/ https://ncbi.nlm.nih.gov/pubmed/33371378 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s20247347 |
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