Genome-wide association studies in tropical maize germplasm reveal novel and known genomic regions for resistance to Northern corn leaf blight

Northern Corn Leaf Blight (NCLB) caused by Setosphaeria turcica, is one of the most important diseases of maize world-wide, and one of the major reasons behind yield losses in maize crop in Asia. In the present investigation, a high-resolution genome wide association study (GWAS) was conducted for N...

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Published in:Sci Rep
Main Authors: Rashid, Zerka, Sofi, Mehrajuddin, Harlapur, Sharanappa I., Kachapur, Rajashekhar M., Dar, Zahoor Ahmed, Singh, Pradeep Kumar, Zaidi, Pervez Haider, Vivek, Bindiganavile Sampath, Nair, Sudha Krishnan
Format: Artigo
Language:Inglês
Published: Nature Publishing Group UK 2020
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Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC7738672/
https://ncbi.nlm.nih.gov/pubmed/33319847
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-78928-5
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