Yoo, S., Sun, W., & Shin, H. (2020). Analysis of a Lateral Grain Boundary for Reducing Performance Variations in Poly-Si 1T-DRAM. Micromachines (Basel).
Citação norma ChicagoYoo, Songyi, Wookyung Sun, and Hyungsoon Shin. "Analysis of a Lateral Grain Boundary for Reducing Performance Variations in Poly-Si 1T-DRAM." Micromachines (Basel) 2020.
Citação norma MLAYoo, Songyi, Wookyung Sun, and Hyungsoon Shin. "Analysis of a Lateral Grain Boundary for Reducing Performance Variations in Poly-Si 1T-DRAM." Micromachines (Basel) 2020.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.