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Precise nanoscale temperature mapping in operational microelectronic devices by use of a phase change material

The microelectronics industry is pushing the fundamental limit on the physical size of individual elements to produce faster and more powerful integrated chips. These chips have nanoscale features that dissipate power resulting in nanoscale hotspots leading to device failures. To understand the reli...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Cheng, Qilong, Rajauria, Sukumar, Schreck, Erhard, Smith, Robert, Wang, Na, Reiner, Jim, Dai, Qing, Bogy, David
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2020
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7674486/
https://ncbi.nlm.nih.gov/pubmed/33208765
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-77021-1
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