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Precise nanoscale temperature mapping in operational microelectronic devices by use of a phase change material
The microelectronics industry is pushing the fundamental limit on the physical size of individual elements to produce faster and more powerful integrated chips. These chips have nanoscale features that dissipate power resulting in nanoscale hotspots leading to device failures. To understand the reli...
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| Publicat a: | Sci Rep |
|---|---|
| Autors principals: | , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group UK
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7674486/ https://ncbi.nlm.nih.gov/pubmed/33208765 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-77021-1 |
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