Cita APA

Wen, Y., Xu, X., Tao, M., Lu, X., Deng, X., Li, X., . . . Zhang, B. (2020). Characterization and Fabrication of the CFM-JTE for 4H-SiC Power Device with High-Efficiency Protection and Increased JTE Dose Tolerance Window. Nanoscale Res Lett.

Citación estilo Chicago

Wen, Yi, Xiao-jie Xu, Meng-ling Tao, Xiao-fei Lu, Xiao-chuan Deng, Xuan Li, Jun-tao Li, Zhi-qiang Li, y Bo Zhang. "Characterization and Fabrication of the CFM-JTE for 4H-SiC Power Device With High-Efficiency Protection and Increased JTE Dose Tolerance Window." Nanoscale Res Lett 2020.

Cita MLA

Wen, Yi, et al. "Characterization and Fabrication of the CFM-JTE for 4H-SiC Power Device With High-Efficiency Protection and Increased JTE Dose Tolerance Window." Nanoscale Res Lett 2020.