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Nanoscale Pattern Decay Monitored Line-by-Line via in-situ Heated AFM
We combine in-situ heated atomic force microscopy (AFM) with automated line-by-line spectral analysis to quantify the relaxation or decay phenomenon of nanopatterned composite polymer films above the glass transition temperature of the composite material. This approach enables assessment of pattern...
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| Publicado no: | ACS Appl Mater Interfaces |
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| Main Authors: | , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7654702/ https://ncbi.nlm.nih.gov/pubmed/32160455 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsami.0c01807 |
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