Shin, M., Bae, K., Jeong, H., Kim, D., Cha, H., & Kwon, H. (2020). Effects of Capping Layers with Different Metals on Electrical Performance and Stability of p-Channel SnO Thin-Film Transistors. Micromachines (Basel).
Citación estilo ChicagoShin, Min-Gyu, Kang-Hwan Bae, Hwan-Seok Jeong, Dae-Hwan Kim, Hyun-Seok Cha, y Hyuck-In Kwon. "Effects of Capping Layers With Different Metals On Electrical Performance and Stability of P-Channel SnO Thin-Film Transistors." Micromachines (Basel) 2020.
Cita MLAShin, Min-Gyu, et al. "Effects of Capping Layers With Different Metals On Electrical Performance and Stability of P-Channel SnO Thin-Film Transistors." Micromachines (Basel) 2020.
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