Somvanshi, D., Ber, E., Bailey, C. S., Pop, E., & Yalon, E. (2020). Improved Current Density and Contact Resistance in Bilayer MoSe(2) Field Effect Transistors by AlO(x) Capping. ACS Appl Mater Interfaces.
Citación estilo ChicagoSomvanshi, Divya, Emanuel Ber, Connor S. Bailey, Eric Pop, y Eilam Yalon. "Improved Current Density and Contact Resistance In Bilayer MoSe(2) Field Effect Transistors By AlO(x) Capping." ACS Appl Mater Interfaces 2020.
Cita MLASomvanshi, Divya, et al. "Improved Current Density and Contact Resistance In Bilayer MoSe(2) Field Effect Transistors By AlO(x) Capping." ACS Appl Mater Interfaces 2020.
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