A carregar...
Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation
Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4H-cyclopenta[2,1-b;3,4-bʹ]dithiophene)-alt-4,7-(2,1...
Na minha lista:
| Publicado no: | Nanomaterials (Basel) |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2020
|
| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7558113/ https://ncbi.nlm.nih.gov/pubmed/32932650 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano10091819 |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|