Cita APA

Pandey, K., Paredis, K., Hantschel, T., Drijbooms, C., & Vandervorst, W. (2020). The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurements. Sci Rep.

Chicago Style Citation

Pandey, Komal, Kristof Paredis, Thomas Hantschel, Chris Drijbooms, i Wilfried Vandervorst. "The Impact of Focused Ion Beam Induced Damage On Scanning Spreading Resistance Microscopy measurements." Sci Rep 2020.

Cita MLA

Pandey, Komal, et al. "The Impact of Focused Ion Beam Induced Damage On Scanning Spreading Resistance Microscopy measurements." Sci Rep 2020.